Presentations

Here are some of our presentations. Full presentations are available upon request. Please click this link to make a request if you need more.

1. Characterization of thin films and stack in MOEMS structure with ellipsometry and reflectometry techniques
2. Ellipsometry, Ellipsometer and Thin Films
3. Atmospheric Stability of E-Beam Deposited Optical Thin Film Stacks
4. Optical Properties of Hafnium Oxide Films Grown by Laser Assisted Molecular Beam Deposition
5. Spectroscopic Ellipsometry (SE) and X-ray Reflectometry (XRR) Analyses on Diffusion Barrier Tungsten Carbide (WC_x) Films
6. Properties of Titanium Oxide Thin Films Prepared with E-beam Evaporation
7. Evaluation on Stress and Optical Properties of Thin Films Used in Optical MEMS (MOEMS) Device
8. Spectroscopic Ellipsometry Study on E-beam Deposited Titanium Dioxide Films