We have collected over 10000 entries on ellipsometry related topics, such as instrumentation, ellipsometry principles, ellipsometry modeling and its applications.
Most of them are from journals and conference proceedings. You can perform search based on your interest with author names, keywords, journal names, etc. From our
experience, it is very useful to learn what other researchers have done, what optical models have been developed, what optical properties were obtained under
specific conditions, and so on. We hope this database will be helpful to you too. We'll keep this database up-to-date. If you have any comments or suggestions, please
feel free to let us know.
Please set the search condition(s), then perform the search. How to search?