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Ellipsometry Database

We have collected over 10000 entries on ellipsometry related topics, such as instrumentation, ellipsometry principles, ellipsometry modeling and its applications. Most of them are from journals and conference proceedings. You can perform search based on your interest with author names, keywords, journal names, etc. From our experience, it is very useful to learn what other researchers have done, what optical models have been developed, what optical properties were obtained under specific conditions, and so on. We hope this database will be helpful to you too. We'll keep this database up-to-date. If you have any comments or suggestions, please feel free to let us know.

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