TFProbe eSE

Angstrom Sun Technologies Inc is glad to introduce education version TFProbe eSE for Universities, start-ups and R&D users. It is affordable and true spectroscopic tool. It comes with advanced TFProbe 3.3 software for system configuration, data acquisition, simulation and regression. Different user log-in level allows Scientists/Engineers to play complicated layer stacks, isotropic/anisotropic, super-lattice, inhomogeneous with various index profile builder, while operator mode provides one-button click to have results, plus lifetime software upgrade without cost and professional application support....


· Specifically designed for education and small R&D activities

· Affordable but still advanced and powerful as those expensive tools

· True spectroscopic Ellipsometer (not single wavelength laser, not LEDs narrow band)

· Table top and Easy to set up, Plug and Play

· Easy to operate with all Window OSs

· Advanced optics design for best system performance

· Variable Angle from 45 to 90 degree range

· Long life (over 10000hrs) ultra stable Vis-NIR light source for broad band applications

· Array based detectors allow fast measurement

· Measure film thickness and Refractive Index up to 120 layers

· System comes with comprehensive optical constants database and model recipes

· Advanced TFProbe Software allows user to use either NK table, dispersion or effective media approximation (EMA) for each individual film.

· Apply to many different type of substrates with different thickness

· Free Life time software upgrade and application support

System Configuration:

· Model: TFProbe eSE

· Detector: CCD Arrays for Fast measurement

· Light Source: Long Life high stable Tungsten-Halogen  light source

· Software: TFProbe 3.3

· Angle Change: Manually

· Wavelength Scan: Automatic

· Stage: 150mm (6”) sample holder

· Precision X-Y-Z stage and 3 points tilting , 0 to 50mm Z range

· Measurement Type: Film thickness, refractive index, multiple layer

· Computer and LCD monitor: Not Included, 2 spare USB ports on PC are requires

· Power: Universal 110– 240 VAC / 50-60Hz, 6 A

· Warranty: One year labor and parts

  • Wavelength range: 370 - 1100 nm
  • Wavelength resolution: better than 0.5 nm
  • Beam Size: 1 to 5 mm configurable
  • Sample Size: up to 200 mm
  • Measurable Thickness Range: up to 50 um for transparent coatings/films
  • Measurable layers: user definable (there is no limit in software setup)
  • Measurement time: typical 3 seconds, user definable
  • Variable incident angle: 45 to 90 degree at 5 degree preset interval
  • Thickness precision: 0.1 nm
  • Index precision: 0.0001

· Photoresist, polyimide, Oxides, Nitrides

· Optical coatings, TiO2, SiO2, Ta2O5…..

· Semiconductor compounds, Cell gaps

· Functional films in MEMS/MOEMS

· Thin film transistors (TFT) stack

· Conductive oxide: Indium Tin Oxide

· Coatings on medical devices

· Amorphous, nano and crystalline films

· Thin Metal Layers

· Solar Films: CIGS, CdTe…….