- Product Showcase
- Spectroscopic Reflectometer SR Series
- Spectroscopic Ellipsometer SE Series
- Microspectrophotometer MSP Series
- Film Thickness Mapping System
- Integrated In-line Metrology
- TFProbe Software
Angstrom Sun Technologies Inc. designs and manufactures a series of cost-effective optical solutions for characterizing film thickness and optical properties (refractive index N and extinction coefficient K). Affordable, low cost, but advanced and high performance tools, including spectroscopic reflectometer, microspectrophotometer and ellipsometers, offer a way to probe film stacks nondestructively and precisely. Please select products listed in left panel to review product's configurations and specifications. For technical aspects, please review publications and Q&A in Support section. You are also welcome to directly contact us or our sales representatives for questions and quotations.